Tera Probe, Inc.
TTSE:66271,807.00
JPY
-178.00
(-8.97%)
ISIN
JP3546550009
Return %
Stock
S&P 500
1Y
68.88
14.20
3Y
84.20
81.12
5Y
418.06
68.34
Capital Structure
JPY
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in mil. unless spec.Working Capital
JPY
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in mil. unless spec.Growth Rates
JPY
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in mil. unless spec.Quarterly Revenue
JPY
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in mil. unless spec.Quarterly Earnings Per Share
JPY
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in mil. unless spec.Quarterly Dividends Per Share
JPY
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in mil. unless spec.Company Description
- CEO
- Tsuyoshi Yokoyama
- Full Time Employees
- 1,127
- Sector
- Commercial services
- Industry
- Miscellaneous commercial services
- Address
- KAKiYA Building Yokohama KN Japan 222-0033
- IPO Date
- Dec 7, 2010
- Website
- teraprobe.com
- Similar Companies
- Business
- Tera Probe, Inc. engages in semiconductor testing services and manufacturing, specializing in contract wafer testing and final testing of semiconductor products including DRAM, SoC, CPUs, image sensors, and analog/mixed devices. The company offers advanced automated, non-contact on-wafer testing solutions for high-frequency electronic devices and integrated circuits covering frequencies from 50 GHz to 1.1 THz and beyond. Its proprietary products include automated probe stations with virtual, contactless probe tips enabling S-parameter characterization of devices without physical contact, which reduces wear and testing costs. Additionally, Tera Probe provides material characterization systems using high-precision robotic arms for accurate measurement of dielectric properties of materials. Services include custom probe design and material characterization testing. Founded in 1994 and headquartered in Yokohama, Japan, the company operates primarily in Japan but services global semiconductor manufacturers. Tera Probe maintains significant business segments in testing technology development and worker dispatching supporting the fast-evolving semiconductor industry. Recent major developments include the introduction of fully automated non-contact probing systems and enhancements in robotic material characterization capabilities enabling precise, repeatable measurements for high-frequency device testing. The company continues to expand its service offerings within the high-frequency test space, aiming to disrupt traditional contact-based microprobe testing technologies by delivering more reliable, cost-efficient alternatives. Tera Probe is a subsidiary of Powertech Technology Inc., which holds a controlling share after a series of acquisitions and investments in the mid-2010s. This strategic relationship has supported Tera Probe’s expansion and capacity to scale testing solutions. In recent financial disclosures up to 2025, Tera Probe has focused on boosting operational efficiency and refining its automated testing platforms to meet the increasing demands for high-speed semiconductor device characterization. Tera Probe’s core market encompasses semiconductor manufacturers requiring device testing solutions that accommodate rapidly evolving integration complexness and higher frequency band applications. Its portfolio addresses critical needs in wafer and final chip testing, meeting stringent quality and performance parameters crucial in cutting-edge semiconductor production. The company serves clients across the electronics manufacturing sector with its innovative probing technologies and material characterization services, ensuring precision in semiconductor device validation at frequencies that are increasingly important in 5G, automotive electronics, and IoT applications.